CMOS-based, spark discharge, optical emission spectrometer
Multi-bases, full spectrum analysis for utmost elemental flexibility
Ultra-low limits of detection
Wavelength range:130nm-800nm, maximum 30+ elements
Long-term stability and repeatability
Excellent vertical optical emission spectroscopy
Vacuum gauge to monitor the vacuum status in real time
Ultra-low carbon, low nitrogen analysis
Small sample analysis applications
CMOS-based, spark discharge, optical emission spectrometer
Multi-bases, full spectrum analysis for utmost elemental flexibility
Ultra-low limits of detection
Wavelength range:130nm-800nm, maximum 30+ elements
Long-term stability and repeatability
Excellent vertical optical emission spectroscopy
Vacuum gauge to monitor the vacuum status in real time
Ultra-low carbon, low nitrogen analysis
Small sample analysis applications
CCD-based, spark discharge, metal analyzer.
Precise analysis of all common metals for incoming and outgoing product quality control.
Effective wavelength range: 130nm-800nm.
Superior scalability to meet the needs of business expansion
Rugged and reliable,
Easy to operate
Available as benchtop or floor model
TY-9000 Optical Emission Spectrometers (Arc/Spark-OES)
CCD-based, spark discharge, metal analyzer.
Precise analysis of all common metals for incoming and outgoing product quality control.
Effective wavelength range: 130nm-800nm.
Superior scalability to meet the needs of business expansion
Rugged and reliable,
Easy to operate
Available as benchtop or floor model
Low total cost of ownership
Vacuum-free optics with fast stabilization
Unmatched analytical performance and reliability
Excellent long-term stability
Easy to use with full PC control
Compact design, small size.
Maximum 20 elements
High resolution CMOS readout system
Low total cost of ownership
Vacuum optics enabling fast stabilization
Excellent long-term stability
Intelligent design, Modular design
Ferrous and non-ferrous applications
Easy to use with full PC control
Friendly user interface
The 4th Generation High Performance Metal Analyzer
CMOS-based, spark discharge, metal detection
Ultra-low limits of detection
High integration, reliability, stability
Lowing operating cost and easy maintenance
Vacuum optical chamber and low argon consumption
Argon jet technology to optimize small sample analysis
Standardized parameter modification
Maximum 30+ elements
High nitrogen (N) analysis 0.03-0.9%
High resolution CMOS readout system
Low total cost of ownership
Vacuum optics enabling fast stabilization
Excellent long-term stability
Intelligent design, Modular design
Ferrous and non-ferrous applications
Easy to use with full PC control
Friendly user interface
The 4th Generation High Performance Metal Analyzer
CMOS-based, spark discharge, metal detection
Ultra-low limits of detection
High integration, reliability, stability
Lowing operating cost and easy maintenance
Vacuum optical chamber and low argon consumption
Argon jet technology to optimize small sample analysis
Standardized parameter modification
Maximum 30+ elements
High nitrogen (N) analysis 0.03-0.9%
High resolution CMOS readout system
Low total cost of ownership
Vacuum optics enabling fast stabilization
Excellent long-term stability
Intelligent design, Modular design
Ferrous and non-ferrous applications
Easy to use with full PC control
Friendly user interface
The 4th Generation High Performance Metal Analyzer
CMOS-based, spark discharge, metal detection
Ultra-low limits of detection
High integration, reliability, stability
Lowing operating cost and easy maintenance
Vacuum optical chamber and low argon consumption
Argon jet technology to optimize small sample analysis
Standardized parameter modification
Maximum 30+ elements
High nitrogen (N) analysis 0.03-0.9%
CMOS-based, spark discharge, optical emission spectrometer
Multi-bases, full spectrum analysis for utmost elemental flexibility
Ultra-low limits of detection
Wavelength range:130nm-800nm, maximum 30+ elements
Long-term stability and repeatability
Excellent vertical optical emission spectroscopy
Vacuum gauge to monitor the vacuum status in real time
Ultra-low carbon, low nitrogen analysis
Small sample analysis applications